Name
Abstract | ||
|---|---|---|
Unknown (X) states are increasingly often identified as having potential for rendering semiconductor tests useless. One of the key requirements for a reliable test response compactor is, therefore, to preserve observability of any scan cell for a wide range of X-profiles while maintaining very high-compaction ratios, providing ability to detect a variety of failures found in real silicon, and assuring design simplicity. We have proposed a fully X-tolerant test response compaction scheme which is based on a flexible scan chain selection mechanism. This new approach delivers extremely high compression of test results by observing that X states are typically not randomly distributed in test responses. Identical or similar patterns of correlated X states let the proposed scheme reduce the size of a scan chain selector and the amount of test data used to control it. It handles, moreover, a wide range of unknown state profiles such that all X states, including those being clustered and of high density, are suppressed in a per-cycle mode without compromising the test quality. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1109/TCAD.2009.2035550 | IEEE Trans. on CAD of Integrated Circuits and Systems |
Keywords | DocType | Volume |
compaction utilizing inter,test result,unknown state,test quality,test data,correlated X state,semiconductor test,X-tolerant test response compaction,wide range,test response,X state,reliable test response compactor | Journal | 29 |
Issue | ISSN | Citations |
1 | 0278-0070 | 15 |
PageRank | References | Authors |
0.61 | 28 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Dariusz Czysz | 1 | 202 | 8.21 |
| Grzegorz Mrugalski | 2 | 501 | 35.90 |
| Nilanjan Mukherjee | 3 | 801 | 57.26 |
| Janusz Rajski | 4 | 2460 | 201.28 |
| Jerzy Tyszer | 5 | 838 | 74.98 |