Paper Info
Title
Functional Test of Field Programmable Analog Arrays
Abstract
In this work a strategy for testing analog networks, known as Transient Response Analysis Method, is applied to test the Configurable Analog Blocks (CABs) of Field Programmable Analog Arrays (FPAAs). In this method the Circuit Under Test (CUT) is programmed to implement first and second order blocks and the transient response of these blocks to known input stimuli is analyzed. Taking advantage of the inherent programmability of the FPAAs, a BIST-based scheme is used in order to obtain an error signal representing the difference between fault-free and faulty CABs. Different functions available in the component programming library are studied and a choice is made in order to obtain the best results in terms of sensitivity and test coverage. A functional fault model based on high-level parameters of the transfer function of the programmed blocks is adopted and the relationship between these parameters and CAB component deviations is investigated, therefore allowing to estimate the fault coverage and test application time of the proposed functional test method.
Year
DOI
Venue
2006
10.1109/VTS.2006.37
VTS
Keywords
Field
DocType
functional test,proposed functional test method,configurable analog blocks,test application time,faulty cabs,component programming library,order block,test coverage,cab component deviation,field programmable analog arrays,fault coverage,field programmable analog array,transient response,fault model,functional testing,transfer function,fpaa,second order
Code coverage,Transient response,Test method,Fault coverage,Computer science,Electronic engineering,Transfer function,Field-programmable analog array,Fault model,Built-in self-test
Conference
ISSN
ISBN
Citations 
1093-0167
0-7695-2514-8
4
PageRank 
References 
Authors
0.56
3
4
Name
Order
Citations
PageRank
T. R. Balen140.56
Jose Vicente Calvano2304.38
M. S. Lubaszewski340.89
Michel Renovell474996.46