Name
Abstract | ||
|---|---|---|
Systems-on-Chips often contain a large amount of embedded memory. In order to obtain sufficiently high yield, efficient diagnosis and repair facilities are needed for the memories. A novel and efficient approach for collecting complete failure data during on-chip memory testing is proposed that can be combined with a row/column reconfiguration algorithm for complete on-chip memory repair. A sequence of diagnostic tests of linear order is utilized that detects and localizes all cells involved in single-cell faults and two-cell coupling faults, such as idempotent coupling faults, and provides this information to on-chip circuitry for memory repair. Failure data are collected at the operating speed of the memory-under-test so that tests can be applied at speed. The data acquisition circuitry evaluates the test results and classifies faults as column failures, coupling faults, or single-cell faults for near-optimal allocation of spare resources. The proposed test and data acquisition algorithm can be realized as compact Built-In Self-Test (BIST) circuitry using standard design libraries. |
Year | DOI | Venue |
|---|---|---|
2003 | 10.1145/944027.944037 | ACM Trans. Design Autom. Electr. Syst. |
Keywords | Field | DocType |
complete failure data,failure data,coupling faults,on-chip repair,column failures,diagnosis,embedded memory,complete on-chip memory repair,memory repair,data acquisition circuitry,data acquisition methodology,memory test,data acquisition algorithm,coupling fault,built-in self-test,single-cell fault,on-chip memory testing,march tests,system on chip,chip,data acquisition,diagnostic test,linear order | Spare part,Coupling,Computer science,Diagnostic test,Parallel computing,Operating speed,Data acquisition,Real-time computing,Memory testing,Built-in self-test,Embedded system,Embedded memory | Journal |
Volume | Issue | ISSN |
8 | 4 | 1084-4309 |
Citations | PageRank | References |
1 | 0.37 | 11 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Dirk Niggemeyer | 1 | 108 | 11.29 |
| Elizabeth M. Rudnick | 2 | 867 | 76.37 |