Title
Optimal Dual-Tone Frequency Selection for ADC Sine-Wave Tests
Abstract
An automated frequency selection algorithm for dual-tone analog-to-digital converter sine-wave test that guarantees optimal test coverage in the phase-plane is presented. The proposed method relaxes some constraints of the existing phase-space design methodology. This enables wider application of the phase-space method in test frequency selection. The proposed algorithm also extends the previous w...
Year
DOI
Venue
2011
10.1109/TIM.2010.2102393
IEEE Transactions on Instrumentation and Measurement
Keywords
Field
DocType
Phase measurement,Testing,Frequency measurement,Algorithm design and analysis,Volume measurement,Harmonic analysis,Coherence
Code coverage,Algorithm design,Coherent sampling,Dynamic testing,Phase plane,Electronic engineering,Harmonic analysis,Sine wave,Mathematics,Phase space method
Journal
Volume
Issue
ISSN
60
5
0018-9456
Citations 
PageRank 
References 
5
0.62
13
Authors
5
Name
Order
Citations
PageRank
Meng Sang Ong1101.52
Ye Chow Kuang27219.81
Melanie Po-Leen Ooi37018.35
Serge N. Demidenko48419.38
Poon Shern Liam591.16