Name
Title | ||
|---|---|---|
Global Built-In Self-Repair for 3D memories with redundancy sharing and parallel testing. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/3DIC.2012.6262967 | 3DIC |
Keywords | Field | DocType |
design for testability,computer architecture,maintenance engineering,redundancy,integrated circuit design,decoding | Design for testing,High memory,Computer science,Parallel computing,Redundancy (engineering),Integrated circuit design,Bandwidth (signal processing),Decoding methods,Maintenance engineering,Embedded system,Built-in self-test | Conference |
Citations | PageRank | References |
9 | 0.54 | 19 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Xiaodong Wang | 1 | 1357 | 192.86 |
| Dilip P. Vasudevan | 2 | 80 | 8.00 |
| Hsien-Hsin Sean Lee | 3 | 1657 | 102.66 |