Name
Abstract | ||
|---|---|---|
We develop a new technique for fault detection based on a new metric, the energy consumptionratio(ECR). ECR-based test can detect faults, such asredundant faults, that escape detection with other techniques. Though the ECR is a metric based on the supplycurrent, an analog parameter, it is remarkably tolerant to the impact of process variations. The quality ofECR-based test is demonstrated through extensive simulation on a process offered by MOSIS. We also presenta test generation algorithm for the new test technique.When applied to benchmark circuits, this technique reliably detects a large fraction of the combinationally redundant faults in them. |
Year | DOI | Venue |
|---|---|---|
1998 | 10.1109/TEST.1998.743300 | ITC |
Keywords | Field | DocType |
process-tolerant test,quality ofecr-based test,asredundant fault,new test technique,process variation,analog parameter,energy consumption ratio,fault detection,ecr-based test,escape detection,new technique,presenta test generation algorithm,automatic test pattern generation,simulation,sun,benchmark testing | Stuck-at fault,Automatic test pattern generation,Fault coverage,Fault detection and isolation,Computer science,Real-time computing,Electronic engineering,Test compression,Electronic circuit,Energy consumption,Supply current | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-7803-5093-6 | 27 |
PageRank | References | Authors |
1.84 | 9 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Bapiraju Vinnakota | 1 | 237 | 25.36 |
| Wanli Jiang | 2 | 113 | 9.16 |
| Dechang Sun | 3 | 32 | 3.17 |