Name
Title | ||
|---|---|---|
A Time Domain Built-In Self-Test Methodology for SNDR and ENOB Tests of Analog-to-Digital Converters |
Abstract | ||
|---|---|---|
In this paper, a built-in self-test (BIST) methodology used to test the important transmission parameters, signal-to-noise-and-distortion (SNDR) and effective number of bits (ENOB), of analog-to-digital converters (ADCs) is proposed. A sigma-delta modulation based signal generator is presented which can concurrently produce high frequency analog sinusoidal test stimuli and digital sinusoidal reference signals on chip. Unlike conventional test methods which compute these parameters based on the spectrum information after fast Fourier transformation (FFT), the presented BIST scheme can directly determine the noise-and-distortion power density and SNDR in time domain. It can reduce the high cost of implementing FFT and windowing functional blocks, and alleviate the difficulty in setting the test frequencies and measurement conditions. |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1109/ATS.2004.18 | Asian Test Symposium |
Keywords | Field | DocType |
digital sinusoidal reference signal,effective number,analog-to-digital converters,bist scheme,high cost,high frequency analog sinusoidal,analog-to-digital converter,time domain built-in self-test,conventional test method,test frequency,built-in self-test,enob tests,test stimulus,sigma delta modulator,spectrum,chip,power density,effective number of bits,fast fourier transform,test methods,high frequency,time domain | Flight dynamics (spacecraft),Time domain,Computer science,Signal generator,Electronic engineering,Converters,Modulation,Effective number of bits,Fast Fourier transform,Built-in self-test | Conference |
ISSN | ISBN | Citations |
1081-7735 | 0-7695-2235-1 | 1 |
PageRank | References | Authors |
0.39 | 7 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hsin-Wen Ting | 1 | 41 | 8.81 |
| Bin-da Liu | 2 | 563 | 66.56 |
| Soon-Jyh Chang | 3 | 655 | 73.67 |