Name
Abstract | ||
|---|---|---|
The class of dynamic faults has been recently shown to be an important class of faults for the new technologies of Random Access Memories (RAM) with significant impact on defect-per-million (DPM) levels. Very little research has been done in the design of memory test algorithms targeting dynamic faults. Two March test algorithms of complexity 11N and 22N, N is the number of memory cells, for subclasses of two-operation single-cell and two-cell dynamic faults, respectively, were proposed recently [Benso et al., Proc., ITC 2005] improving the length of the corresponding tests proposed earlier [Hamdioui et al., Proc. of IEEE VLSI Test Symposium, pp. 395---400, 2002]. Also, a March test of length 100N was proposed [Benso et al., Proc. ETS 2005, Tallinn, pp. 122---127, 2005] for detection of two-cell dynamic faults with two fault-sensitizing operations both applied on the victim or aggressor cells. In this paper, for the first time, March test algorithms of minimum length are proposed for two-operation single-cell and two-cell dynamic faults. In particular, the previously known March test algorithm of length 100N for detection of two-operation two-cell dynamic faults is improved by 30N. |
Year | DOI | Venue |
|---|---|---|
2007 | 10.1007/s10836-006-9504-8 | J. Electronic Testing |
Keywords | Field | DocType |
random access memories,dynamic fault primitives,dynamic functional fault models,march test algorithms,fault detection | Test algorithm,Computer science,Fault detection and isolation,Parallel computing,Real-time computing,Vlsi test,Random access | Journal |
Volume | Issue | ISSN |
23 | 1 | 0923-8174 |
Citations | PageRank | References |
0 | 0.34 | 10 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| G. Harutunyan | 1 | 37 | 4.42 |
| V. A. Vardanian | 2 | 38 | 4.54 |
| Y. Zorian | 3 | 499 | 47.97 |