Name
Abstract | ||
|---|---|---|
Given any combinational, internal fan-out-free network and any complete single fault detection test set (SFDTS) for the network, we consider in this paper the problem of determining the minimal extent to which that SFDTS will cover multiple faults in the network. The basis of our approach is the development of a generic perspective to multiple faults which uses a representation of such faults called an L-expression. This perspective leads to a technique for obtaining the greatest lower bound on the multiple fault coverage capability of an SFDTS by means of a simple table look-up process. In addition to generalizing previously known results regarding multiple fault coverage, two particularly interesting results obtained from this approach are as follows: 1) On the average, every SFDTS for an internal fan-out-free network covers 92 percent of all multiple faults of sizes 8 and less. 2) On the average, every SFDTS for an internal fan-out-free network covers at least 46.1 percent of all multiple faults. |
Year | DOI | Venue |
|---|---|---|
1980 | 10.1109/TC.1980.1675567 | IEEE Trans. Computers |
Keywords | Field | DocType |
generic fault characterizations,complete single fault detection,simple table look-up process,multiple fault,multiple fault coverage capability,minimal extent,test set,internal fan-out-free network,generic perspective,table look-up coverage bounding,interesting result,multiple fault coverage,fault detection,combinational circuits,helium,sequential circuits,testing,logic design,registers | Stuck-at fault,Fault coverage,Generalization,Fault detection and isolation,Minimal extent,Upper and lower bounds,Computer science,Algorithm,Bounding overwatch,Test set | Journal |
Volume | Issue | ISSN |
29 | 4 | 0018-9340 |
Citations | PageRank | References |
9 | 2.52 | 15 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| V. K. Agarwal | 1 | 360 | 44.82 |
| G. M. Masson | 2 | 221 | 50.71 |