Diagnosis of clustered faults and wafer testing | 16 | 0.74 | 1998 |
Fast signature computation for BIST linear compactors | 1 | 0.37 | 1995 |
Distributed Probabilistic Diagnosis of MCMs on Large Area | 4 | 0.60 | 1995 |
Almost Sure Diagnosis of Almost Every Good Element | 17 | 1.22 | 1994 |
Performance of Interconnection Network in Multithreaded Architectures | 1 | 0.36 | 1994 |
Diagnosis of t/(t +1)-Diagnosable Systems | 16 | 0.86 | 1994 |
Multiprocessor Fault Diagnosis Under Local Constraints | 13 | 0.92 | 1993 |
BIST of PCB interconnects using boundary-scan architecture | 17 | 0.94 | 1992 |
Performance Evaluation of Latency Tolerant Architectures | 3 | 0.46 | 1992 |
Using an asymmetric error model to study aliasing in signature analysis registers | 5 | 0.49 | 1992 |
Iterative algorithms for computing aliasing probabilities | 1 | 0.38 | 1991 |
A New Procedure For Weighted Random Built In Self Test | 95 | 9.71 | 1990 |
Optimizing error masking in BIST by output data modification | 20 | 2.78 | 1990 |
Experiments on aliasing in signature analysis registers | 9 | 0.88 | 1989 |
t/s-Diagnosable Systems: A Characterization and Diagnosis Algorithm | 2 | 0.52 | 1989 |
An analysis of the probabilistic behavior of linear feedback signature registers | 12 | 1.07 | 1989 |
On the Complexity of Single Fault Set Diagnosability and Diagnosis Problems | 7 | 1.26 | 1989 |
A Generalized Theory for System Level Diagnosis | 61 | 4.62 | 1987 |
McBOOLE: A New Procedure for Exact Logic Minimization | 23 | 4.99 | 1986 |
Soft-error filtering: A solution to the reliability problem of future VLSI digital circuits | 17 | 3.76 | 1986 |
Higher certainty of error coverage by output data modification | 7 | 1.37 | 1984 |
A design for machines with built-in tolerance to soft errors | 2 | 2.76 | 1984 |
Generic Fault Characterizations for Table Look-Up Coverage Bounding | 9 | 2.52 | 1980 |
Recursive Coverage Projection of Test Sets | 1 | 0.48 | 1979 |
Resolution-Oriented Fault Interrelationships in Combinational Logic Networks | 1 | 0.75 | 1977 |