Name
Abstract | ||
|---|---|---|
This paper addresses a critical issue faced in thetesting of devices and modules that support bi-directionaldata paths switching in a nanosecond or less. Currentmethods are first summarized and clarified in order tohighlight their limitations when applied to higherperformance signals. Next, two alternatives are presentedthat overcome these limitations. An "interleaving" methoduses a single, matched-impedance transmission line betweenthe device-under-test (DUT) and the test system pinelectronics. The transmission line delay is carefully matchedto the desired data rate to avoid "bus contention" problemsat the pin electronics receiver. This method supports highspeed signals and switching rates, but is limited to discretefrequencies. The second method proposes the use oftechnology-specific transceivers, located very close to theDUT. This method greatly reduces the "transmission-line"effects and supports high speed bi-directional testingthroughout a wide range of frequencies. Furthermore, itrepresents a significant paradigm shift from the traditionalATE architecture that has so far provided general-purposepin electronics on every test channel. In the long run,separation and specialization of the "pin electronics" mayultimately reduce future ATE costs. |
Year | DOI | Venue |
|---|---|---|
1998 | 10.1109/TEST.1998.743269 | ITC |
Keywords | Field | DocType |
test system pinelectronics,test channel,alternative interface method,general-purposepin electronics,transmission line delay,matched-impedance transmission line betweenthe,high speed bidirectional signal,data rate,bus contention,critical issue,bi-directionaldata path,pin electronics receiver,transmission lines,transceivers,frequency,automatic test equipment,paradigm shift,system testing,electronics packaging,device under test,power transmission lines,transmission line,impedance matching | Transceiver,Transmission line,Computer science,Automatic test equipment,Impedance matching,Communication channel,Electronic engineering,Electronics,Bus contention,Electrical engineering,Interleaving | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-7803-5093-6 | 5 |
PageRank | References | Authors |
0.65 | 3 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| David C. Keezer | 1 | 68 | 17.00 |
| Q. Zhou | 2 | 5 | 0.65 |