Name
Abstract | ||
|---|---|---|
In a recent work from Eurocrypt 2011, Renauld et al. discussed the impact of the increased variability in nanoscale CMOS devices on their evaluation against side-channel attacks. In this paper, we complement this work by analyzing an implementation of the AES S-box, in the DDSLL dual-rail logic style, using the same 65-nanometer technology. For this purpose, we first compare the performance results of the static CMOS and dual-rail S-boxes. We show that full custom design allows to nicely mitigate the performance drawbacks that are usually reported for dual-rail circuits. Next, we evaluate the side-channel leakages of these S-boxes, using both simulations and actual measurements. We take advantage of state-of-the-art evaluation tools, and discuss the quantity and nature (e.g. linearity) of the physical information they provide. Our results show that the security improvement of the DDSLL S-box is typically in the range of one order of magnitude (in terms of "number of traces to recover the key"). They also confirm the importance of a profiled information theoretic analysis for the worst-case security evaluation of leaking devices. They finally raise the important question whether dual-rail logic styles remain a promising approach for reducing the side-channel information leakages in front of technology scaling, as hardware constraints such as balanced routing may become increasingly challenging to fulfill, as circuit sizes tend towards the nanometer scale. |
Year | Venue | Keywords |
|---|---|---|
2011 | CHES | dual-rail logic style,dual-rail s-boxes,65-nanometer ddsll aes s-box,information theoretic analysis,state-of-the-art evaluation tool,side-channel attack,side-channel leakage,security analysis,dual-rail circuit,physical information,side-channel information leakage,ddsll dual-rail logic style |
Field | DocType | Volume |
S-box,Information leakage,Computer science,Physical information,Theoretical computer science,Full custom,CMOS,Security analysis,Electronic circuit,Current-mode logic | Conference | 6917 |
ISSN | Citations | PageRank |
0302-9743 | 13 | 0.66 |
References | Authors | |
25 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Mathieu Renauld | 1 | 225 | 9.80 |
| Dina Kamel | 2 | 118 | 8.58 |
| François-Xavier Standaert | 3 | 3070 | 193.51 |
| Denis Flandre | 4 | 316 | 70.47 |