Title
Embedded Tutorial: Modeling Parasitic Coupling Effects in Reliability Verification
Abstract
No abstract available.
Year
Venue
Keywords
2002
VLSI Design
reliability verification,modeling parasitic coupling effects,transmission lines,interconnect,rlc circuits
Field
DocType
ISBN
Coupling,Computer science,Electronic engineering,Electric power transmission,Interconnection,RLC circuit,Electrical engineering
Conference
0-7695-1441-3
Citations 
PageRank 
References 
0
0.34
0
Authors
3
Name
Order
Citations
PageRank
N. S. Nagaraj18617.37
P. Balsara200.34
C. Cantrell300.34