Paper Info
Title
Diagnostic Testing of Embedded Memories Based on Output Tracing
Abstract
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a given fault model. The approach is based on decomposition of functional memory faults into basic fault effects and output tracing. Output tracing involves storing all read operation results for defective memory cells and replaces the commonly used evaluation of a 驴fail驴 signal. In particular, we examine memory tests of linear order (O(N)), since this class of tests requires low-test application times and is realizable as Built-In Self-Test circuitry with very low area overhead.
Year
DOI
Venue
2000
10.1109/MTDT.2000.868624
San Jose, CA
Keywords
Field
DocType
complete detection,memory test,diagnostic testing,functional memory fault,basic fault effect,embedded memory,output tracing,defective memory cell,fault model,built-in self-test circuitry,new approach,information technology,embedded systems,diagnostic test,linear order,fault detection,embedded computing,system testing,vlsi,system on a chip
Diagnostic test,Computer science,Memory faults,Parallel computing,Very-large-scale integration,Memory architecture,Tracing,Fault model,Built-in self-test
Conference
ISSN
ISBN
Citations 
1087-4852
0-7695-0689-5
11
PageRank 
References 
Authors
0.84
9
3
Name
Order
Citations
PageRank
Dirk Niggemeyer110811.29
Elizabeth M. Rudnick286776.37
Michael Redeker3110.84