Title
Generating decision regions in analog measurement spaces
Abstract
We develop a neural network that learns to separate the nominal from the faulty instances of a circuit in a measurement space. We demonstrate that the required separation boundaries are, in general, non-linear. Unlike previous solutions which draw hyperplanes, our network is capable of drawing the necessary non-linear hypersurfaces. The hypersurfaces translate to test criteria that are strongly correlated to functional tests. A feature selection algorithm interacts with the network to identify a discriminative low-dimensional measurement space.
Year
DOI
Venue
2005
10.1145/1057661.1057684
ACM Great Lakes Symposium on VLSI
Keywords
Field
DocType
analog measurement space,previous solution,required separation boundary,generating decision region,measurement space,neural network,faulty instance,necessary non-linear hypersurfaces,discriminative low-dimensional measurement space,functional test,feature selection algorithm interacts,feature selection,functional testing,neural networks,analog circuits
Analogue electronics,Feature selection,Computer science,Algorithm,Electronic engineering,Theoretical computer science,Hyperplane,Artificial neural network,Discriminative model
Conference
ISBN
Citations 
PageRank 
1-59593-057-4
1
0.36
References 
Authors
5
2
Name
Order
Citations
PageRank
Haralampos-G. D. Stratigopoulos125228.06
Yiorgos Makris21365107.21