Title
A self-test and dynamics characterization circuit for MEMS electrostatic actuators
Abstract
This paper presents a high-bandwidth capacitance estimation and driving circuit especially tailored for its use with MEMS electrostatic actuators. The circuit can be integrated as a part of a system comprising an electrostatic actuator to provide self-testing and failure prediction capabilities and also as a simple and low-cost actuator dynamics characterization system capable of measuring both periodic and non-periodic movements.
Year
DOI
Venue
2011
10.1016/j.microrel.2010.09.027
Microelectronics Reliability
Field
DocType
Volume
Capacitance,Microelectromechanical systems,Electronic engineering,Driving circuit,Engineering,Self test,Periodic graph (geometry),Dynamical system,Actuator,Estimator
Journal
51
Issue
ISSN
Citations 
3
0026-2714
1
PageRank 
References 
Authors
0.40
2
3
Name
Order
Citations
PageRank
Daniel Fernández1276.82
Jordi Madrenas215027.87
Jordi Cosp3366.25