Name
Abstract | ||
|---|---|---|
The fault coverage of existing functional tests can be enhanced by additional observation points. For a given set of functional tests, this paper proposes an efficient fault-dropping fault simulation method for selecting a subset of observation points at a small fraction of the cost of non-fault-dropping fault simulation. Experimental results on industrial circuits demonstrate the effectiveness of the method in achieving close to optimal results in the size of the selected subset with an order of magnitude less time, without losing achievable coverage. The technique is particularly applicable to industrial designs where fault-simulation times can be prohibitively expensive, even when only a sample of faults is simulated using distributed techniques. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1109/ISQED.2008.113 | ISQED |
Keywords | Field | DocType |
functional tests,efficient selection,non-fault-dropping fault simulation,efficient fault-dropping fault simulation,observation points,additional observation point,observation point,selected subset,industrial circuit,industrial design,achievable coverage,functional test,fault coverage,functional testing,integrated circuit design,manufacturing,automatic test pattern generation,cost function,computational modeling | Automatic test pattern generation,Fault coverage,Computer science,Logic testing,Real-time computing,Electronic engineering,Test pattern generators,Integrated circuit design,Electronic circuit,Order of magnitude,Reliability engineering | Conference |
Citations | PageRank | References |
2 | 0.38 | 13 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jian Kang | 1 | 2 | 0.38 |
| Sharad C. Seth | 2 | 671 | 93.61 |
| Yi-Shing Chang | 3 | 162 | 17.13 |
| Vijay Gangaram | 4 | 35 | 4.16 |