Name
Abstract | ||
|---|---|---|
An Application-Dependent test strategy to be used byan FPGA user is presented which requires only 3 testconfigurations. In this specific strategy, the interconnectis first tested by modifying the logic block configurationand preserving the interconnect configuration. Then, theused logic blocks are fully tested by modifying theinterconnect configuration. Results for some benchmarkapplications mapped into the Xilinx FPGAs are alsoprovided. |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1109/VTEST.2004.1299239 | VTS |
Keywords | Field | DocType |
logic block configurationand,application dependent testing,byan fpga user,multi-configuration strategy,theused logic block,specific strategy,theinterconnect configuration,xilinx fpgas,application-dependent test strategy,automatic test pattern generation,application software,fault tolerance,manufacturing,benchmark testing,field programmable gate arrays | Logic synthesis,Complex programmable logic device,Computer science,Logic optimization,Programmable logic array,Field-programmable gate array,Electronic engineering,Logic block,Logic family,Programmable logic device,Embedded system | Conference |
ISSN | ISBN | Citations |
1093-0167 | 0-7695-2134-7 | 18 |
PageRank | References | Authors |
1.14 | 6 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Mehdi B. Tahoori | 1 | 1537 | 163.44 |
| Edward J. Mccluskey | 2 | 3868 | 501.21 |
| Michel Renovell | 3 | 749 | 96.46 |
| Philippe Faure | 4 | 25 | 2.96 |