Name
Abstract | ||
|---|---|---|
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Input Change (RSIC) generation, that can be used to generate tests for many arbitrary misbehaviors that can occur in digital systems, thus providing a single on-chip test generation solution. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1109/VTS.2002.1011126 | VLSI Test Symposium, 2002. |
Keywords | Field | DocType |
efficient test sequences,good coverage,random single input change,arbitrary misbehavior,different fault type,high defect coverage,comprehensive test vector generation,digital system,single on-chip test generation,system on a chip,system testing,semiconductor device modeling,chip,sequences | Automatic test pattern generation,Test vector generation,Fault coverage,Computer science,Automatic test equipment,Logic testing,Real-time computing,Electronic engineering,Test compression,Computer engineering,Built-in self-test | Conference |
ISSN | Citations | PageRank |
1093-0167 | 12 | 0.68 |
References | Authors | |
10 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| David R. Foster | 1 | 30 | 2.57 |
| P. Girard | 2 | 478 | 41.91 |
| C. Landrault | 3 | 52 | 3.07 |
| S. Pravossoudovitch | 4 | 689 | 54.12 |
| A. Virazel | 5 | 169 | 23.25 |