Name
Abstract | ||
|---|---|---|
This paper presents a new March test solution fordetection of ADOFs, Address Decoder Open Faults, andresistive-ADOFs that are the consequence of resistive-opendefects in address decoders of SRAM memories. Inthis study, we briefly analyze the test conditions and theMarch test requirements for these particular faults and weintroduce some modifications to the well known March C-making it able to detect ADOFs and resistive-ADOFs,without increasing its complexity and its ability to detectthe former target faults. The reformulation of March C-, called March iC-, is essentially based on introducing aparticular address sequence and a particular read/writedata sequence. The proposed March iC- extends the abilityof March-based test solutions in detecting dynamic faultsin SRAM memories. |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1109/VTEST.2004.1299236 | VTS |
Keywords | Field | DocType |
adofs detection,aparticular address sequence,themarch test requirement,test condition,abilityof march-based test solution,dynamic faultsin sram memory,improved version,particular fault,test solution fordetection,march ic,sram memory,particular read,address decoder,static random access memory,fault detection,silicon,testing,integrated circuit,very large scale integration,robots,decoding,government | Fault detection and isolation,Computer science,Logic testing,Static random-access memory,Electronic engineering,Test requirements,Decoding methods,Very-large-scale integration,Address decoder | Conference |
ISSN | ISBN | Citations |
1093-0167 | 0-7695-2134-7 | 16 |
PageRank | References | Authors |
1.10 | 12 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| L. Dilillo | 1 | 44 | 9.49 |
| P. Girard | 2 | 478 | 41.91 |
| S. Pravossoudovitch | 3 | 689 | 54.12 |
| A. Virazel | 4 | 169 | 23.25 |
| S. Borri | 5 | 16 | 1.10 |