Name
Abstract | ||
|---|---|---|
This paper presents an overview of test techniques that offer promising features when Built-In-Self-Test (BIST) must be applied to complex integrated systems including analog, mixed-signal and RF parts. Emphasis is on techniques exhibiting a good trade-off between test requirements (basically in terms of signal accuracy and frequency) and test quality. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1109/DELTA.2010.67 | Ho Chi Minh City |
Keywords | Field | DocType |
mixed signal integrated circuit,radio frequency,system on a chip,sensors,accuracy,system on chip,integrable system,baseband | Baseband,System on a chip,Computer science,Test quality,Electronic engineering,Radio frequency,Test requirements,Integrated systems,Mixed-signal integrated circuit,Built-in self-test | Conference |
ISBN | Citations | PageRank |
978-1-4244-6026-7 | 1 | 0.36 |
References | Authors | |
29 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Manuel J. Barragan Asian | 1 | 53 | 7.27 |
| Gloria Huertas | 2 | 74 | 13.29 |
| Adoración Rueda | 3 | 275 | 40.01 |
| José L. Huertas | 4 | 159 | 18.91 |