Name
Year | Venue | Field |
|---|---|---|
2011 | IPSJ T. on System LSI Design Methodology | Logic gate,Computer science,Test quality,Real-time computing,Test design,Register-transfer level,Test compression,Electronic circuit,Reliability engineering |
DocType | Volume | Citations |
Journal | 4 | 0 |
PageRank | References | Authors |
0.34 | 73 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Seiji Kajihara | 1 | 989 | 73.60 |
| Satoshi Ohtake | 2 | 135 | 21.62 |
| Tomokazu Yoneda | 3 | 154 | 19.35 |