Title
A Small Chip Area Stochastic Calibration for TDC Using Ring Oscillator
Abstract
This paper proposes a small chip area stochastic calibration for TDC linearity and input range, and analyzes it with FPGA. The proposed calibration estimates the absolute values of the delay of the buffers and the range of measurement statistically. The hardware implementation of the proposed calibration requires single counter to construct the histogram, so that the extra area for the proposed calibration is smaller. Because the implementation is fully digital, it is easily implemented on digital LSIs such as FPGA, micro-processor, and SoC. Experiments with Xilinx Virtex-5 LX FPGA ML501 reveal that both the periods of the external clock and the ring oscillator are preferred as short as possible under more than twice of the range of measurement of TDC when the oscillation period of the ring oscillator is wider than that of the external clock for fast convergence. The required time for the proposed calibration is 0.08 ms, and the required hardware resources LUTs and FFs for the implementation on FPGA are 24.1% and 22.2% of the conventional implementation, respectively.
Year
DOI
Venue
2014
10.1007/s10836-014-5486-0
Journal of Electronic Testing: Theory and Applications
Keywords
Field
DocType
TDC,Stochastic calibration,Self compensation,Self Test,FPGA
Convergence (routing),Histogram,Ring oscillator,Oscillation,Computer science,Linearity,Field-programmable gate array,Chip,Electronic engineering,Real-time computing,Calibration
Journal
Volume
Issue
ISSN
30
6
0923-8174
Citations 
PageRank 
References 
4
0.46
7
Authors
7
Name
Order
Citations
PageRank
Kentaroh Katoh1346.64
Yutaro Kobayashi241.47
Takeshi Chujo340.46
Junshan Wang452.50
Ensi Li541.14
Congbing Li651.19
Haruo Kobayashi73825.15