Title
An 8 bit 0.3–0.8 V 0.2–40 MS/s 2-bit/Step SAR ADC With Successively Activated Threshold Configuring Comparators in 40 nm CMOS
Abstract
A 0.3-0.8 V low-power 2-bit/step asynchronous successive approximation register analog-to-digital converter (ADC) is presented. A low-power 2-bit/step operation technique is proposed which uses dynamic threshold configuring comparator instead of multiple digital-to-analog converters (DACs). Power and area overhead is minimized by successively activated comparators. The comparator threshold is configured by simple Vcm biased current source, which keep the ADC free from power supply variations over 10%. Simple digital calibration is enabled by generating the reference internally. The prototype ADC fabricated in a 40 nm CMOS achieved a 44.3 dB signal-to-noise-plus-distortion ratio (SNDR) with 6.14 MS/s at a single supply voltage of 0.5 V. The ADC achieved a peak FoM of 4.8 fJ/conv-step at 0.4 V and operates down to 0.3 V.
Year
DOI
Venue
2015
10.1109/TVLSI.2014.2304733
IEEE Trans. VLSI Syst.
Keywords
Field
DocType
transistors,capacitors,calibration
Comparator,Current source,Computer science,Voltage,8-bit,Electronic engineering,CMOS,Real-time computing,Flash ADC,Successive approximation ADC,Transistor,Electrical engineering
Journal
Volume
Issue
ISSN
23
2
1063-8210
Citations 
PageRank 
References 
4
0.54
20
Authors
5
Name
Order
Citations
PageRank
Kentaro Yoshioka1549.04
Akira Shikata2779.08
Ryota Sekimoto3779.08
Tadahiro Kuroda4659213.23
Hiroki Ishikuro528552.15