Paper Info
Title
A Novel Technique for Ring Oscillator Based PUFs to Enroll Stable Challenge Response Pairs
Abstract
Silicon physical unclonable function (PUF) exploits random variations in the manufacturing process to extract unique information for each chip. As one of the most popular techniques to implement a PUF, ring oscillator based PUF (RO-PUF) is easy to implement for both ASIC and FPGA. However, RO-PUF suffers from the lack of reliability caused by temperature and supply voltage variations. In this paper, we proposed a post-processing technique to improve the reliability of RO-PUF. The main idea is that we allow RO-PUF to generate unstable responses as long as we can find means to filter them out during enrollment. Our proposed scheme generates a signal indicating whether the response is stable, and we could filter out unstable challenge response pairs depending on this signal during enrollment. Experimental results showed that the error rate of challenge response pairs enrolled by our proposed scheme was reduced from 19.94% to 0.35% due to voltage variation, and it was reduced from 6.65% to 0.10% due to temperature variation.
Year
DOI
Venue
2014
10.1109/CIT.2014.145
CIT
Keywords
DocType
ISSN
supply voltage variation,ro-puf,challenge response pair,fpga,error rate,asic,ring oscillator, physical unclonable function, challenge response pair, reliability, error rate, voltage variation, temperature variation,silicon physical unclonable function,application specific integrated circuits,post-processing technique,physical unclonable function,ring oscillator,logic design,response pairs,voltage variation,reliability,temperature variation,manufacturing process,field programmable gate arrays,oscillators
Conference
2474-9648
Citations 
PageRank 
References 
0
0.34
15
Authors
2
Name
Order
Citations
PageRank
Chaohui Du171.20
Guoqiang Bai27514.56