Title
Near optimal repair rate built-in redundancy analysis with very small hardware overhead
Abstract
As the memory density and capacity grows, it is more likely that the number of defects increases. For this reason, in order to improve memory yield, repair analysis is widely used. Built-in redundancy analysis (BIRA) is regarded as one of the solutions to improve memory yield. However, the previous BIRA approaches require large hardware overhead to achieve an optimal repair rate. This is the main obstacle to use BIRA practically. Therefore, a new BIRA is proposed to reduce the hardware overhead significantly using spare allocation probability according to the number of faults on a sparse faulty line. The experimental results show that the hardware overhead of the proposed approach can be considerably reduced with slight loss of repair rate. Therefore, it can be used as a practical solution for BIRA.
Year
DOI
Venue
2015
10.1109/ISQED.2015.7085465
ISQED
Keywords
Field
DocType
resource management,computer aided manufacturing,probability,redundancy,maintenance engineering,algorithm design and analysis,hardware
Computer-aided manufacturing,Algorithm design,Spare part,Computer science,Real-time computing,Repair rate,Redundancy (engineering),Computer hardware,Reliability engineering,Maintenance engineering,Built-in self-test
Conference
ISSN
Citations 
PageRank 
1948-3287
0
0.34
References 
Authors
8
4
Name
Order
Citations
PageRank
Woosung Lee100.34
Keewon Cho2184.64
Jooyoung Kim342.39
Sungho Kang443678.44