Name
Abstract | ||
|---|---|---|
In the paper, two methods of ensuring high quality of the memory built-in self-test tools are presented. The described ideas illustrate general methods and are applicable to any commercial memory BIST tool. The first solution describes controller emulation in order to validate each step of the real controller's operations. The second approach presents a way to determine the test algorithms' fault coverage by means of the memory fault simulator. The experimental results show functional benefits and effectiveness of the proposed solutions. |
Year | DOI | Venue |
|---|---|---|
2014 | 10.1109/DDECS.2014.6868760 | DDECS |
Keywords | Field | DocType |
integrated memory circuits,memory fault simulator,quality assurance,memory built-in self-test tools,built-in self test,controller emulation,decoding,emulation | Control theory,Fault coverage,Computer science,Real-time computing,Electronic engineering,Emulation,Fault Simulator,Decoding methods,Computer engineering,Quality assurance,Built-in self-test,Hardware emulation | Conference |
ISSN | Citations | PageRank |
2334-3133 | 1 | 0.37 |
References | Authors | |
2 | 6 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Albert Au | 1 | 1 | 0.37 |
| Artur Pogiel | 2 | 22 | 4.38 |
| Janusz Rajski | 3 | 2460 | 201.28 |
| Piotr Sydow | 4 | 1 | 0.37 |
| Jerzy Tyszer | 5 | 838 | 74.98 |
| Justyna Zawada | 6 | 20 | 3.48 |