Name
Abstract | ||
|---|---|---|
The performance of a fast fault simulation algorithm for combinational circuits, such as the critical-path-tracing method, is determined primarily by the efficiency with which it can deduce the detectability of stem faults (stem analysis). A graph-based approach to perform stem analysis is proposed. A dynamic data structure, called the criticality constraint graph, is used during the backward pass to carry information related to self-masking and multiple-path sensitization of stem faults. The structure is updated in such a way that when stems are reached, their criticality can be found by looking at the criticality constraints on their fanout branches. Compared to the critical-path-tracing method, the algorithm is exact and does not require forward propagation of individual stem faults. Several examples which illustrate the power of the algorithm are given. Preliminary data on an implementation are also provided.<> |
Year | DOI | Venue |
|---|---|---|
1988 | 10.1109/ICCAD.1988.122486 | ICCAD |
Keywords | Field | DocType |
efficiency,criticality constraint graph,combinational circuits,fanout branches,backward pass,circuit analysis computing,self-masking,data structures,multiple-path sensitization,dynamic data structure,fast fault simulation algorithm,stem fault detectability,digital simulation,graph theory,stem analysis,fault location,critical-path-tracing method,graph-based approach,performance,combinatorial circuits,critical path,combinational circuit | Stuck-at fault,Graph theory,Data structure,Computer science,Constraint graph,Algorithm,Combinational logic,Electronic engineering,Criticality,Simulation algorithm,Fault model | Conference |
Citations | PageRank | References |
10 | 3.46 | 1 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Wuudiann Ke | 1 | 10 | 3.46 |
| Sharad C. Seth | 2 | 671 | 93.61 |
| Bhargab B. Bhattacharya | 3 | 10 | 3.46 |