Title
Variability analysis of a 28nm near-threshold synchronous voltage converter
Abstract
An important synchronous circuit element in low-power digital circuit design is the voltage level shifter at the boundary between voltage domains. In this paper, we present a full variability analysis of an optimized, synchronous pulsed half-latch level converter (PHLC) in the GLOBALFOUNDRIES 28nm technology. The variability analysis clearly illustrates the impact of ultra-low-power design on delay, energy and the energy-delay product (EDP). In particular, the normalized standard deviation for EDP in near-threshold operation is more than twice its value for nominal-supply operation. The analysis also illustrates the impact of variability on the architectural and topological decisions a designer has to make in ultra-low power design.
Year
DOI
Venue
2013
10.1109/ICECS.2013.6815516
ICECS
Keywords
Field
DocType
voltage converters,variability analysis,synchronous pulsed half-latch level converter,near-threshold design,nanotechnology,voltage level shifter,size 28 nm,digital circuits,low-power digital circuit design,low-power electronics,foundries,globalfoundries,synchronous circuit element,energy-delay product,ultra-low-power design,synchronous voltage converter,fluctuations,computer architecture,transistors,threshold voltage
Voltage converter,Computer science,Voltage,Electronic engineering,Synchronous circuit,Normalized standard deviation,Logic level,Transistor,Threshold voltage,Level converter,Electrical engineering
Conference
Citations 
PageRank 
References 
1
0.36
6
Authors
4
Name
Order
Citations
PageRank
Temesghen Tekeste110.36
Ayman Shabra243.97
Duane Boning320149.37
Ibrahim M. Elfadel424244.16