| Robust Reinforcement Learning on State Observations with Learned Optimal Adversary | 0 | 0.34 | 2021 |
| Variational Inference Formulation For A Model-Free Simulation Of A Dynamical System With Unknown Parameters By A Recurrent Neural Network | 0 | 0.34 | 2021 |
| On Lp-norm Robustness of Ensemble Decision Stumps and Trees | 0 | 0.34 | 2020 |
| Wafer Map Defect Patterns Classification Using Deep Selective Learning | 0 | 0.34 | 2020 |
| Multi-Stage Influence Function | 0 | 0.34 | 2020 |
| Towards Stable and Efficient Training of Verifiably Robust Neural Networks | 1 | 0.34 | 2020 |
| Robust Deep Reinforcement Learning against Adversarial Perturbations on State Observations | 0 | 0.34 | 2020 |
| The Limitations of Adversarial Training and the Blind-Spot Attack. | 5 | 0.40 | 2019 |
| Towards Stable and Efficient Training of Verifiably Robust Neural Networks. | 0 | 0.34 | 2019 |
| Robust Decision Trees Against Adversarial Examples. | 1 | 0.35 | 2019 |
| Towards Fast Computation of Certified Robustness for ReLU Networks. | 19 | 0.58 | 2018 |
| Efficient Spatial Variation Characterization via Matrix Completion. | 0 | 0.34 | 2017 |
| Online and incremental machine learning approaches for IC yield improvement. | 0 | 0.34 | 2017 |
| A 12b 250 MS/s Pipelined ADC With Virtual Ground Reference Buffers | 3 | 0.44 | 2015 |
| Efficient performance estimation with very small sample size via physical subspace projection and maximum a posteriori estimation | 5 | 0.48 | 2014 |
| Remembrance of Transistors Past: Compact Model Parameter Extraction Using Bayesian Inference and Incomplete New Measurements | 6 | 0.47 | 2014 |
| An ultra-compact virtual source FET model for deeply-scaled devices: Parameter extraction and validation for standard cell libraries and digital circuits | 5 | 0.54 | 2013 |
| Variability analysis of a 28nm near-threshold synchronous voltage converter | 1 | 0.36 | 2013 |
| Statistical modeling with the virtual source MOSFET model | 7 | 0.60 | 2013 |
| Efficient Spatial Pattern Analysis for Variation Decomposition Via Robust Sparse Regression | 7 | 0.50 | 2013 |
| Spatial variation decomposition via sparse regression | 0 | 0.34 | 2012 |
| Test structure, circuits and extraction methods to determine the radius of infuence of STI and polysilicon pattern density | 2 | 0.41 | 2012 |
| Methodology for analysis of TSV stress induced transistor variation and circuit performance | 6 | 0.64 | 2012 |
| A simple array-based test structure for the AC variability characterization of MOSFETs | 2 | 0.40 | 2011 |
| Toward efficient spatial variation decomposition via sparse regression | 6 | 0.65 | 2011 |
| Redundancy in SAR ADCs | 0 | 0.34 | 2011 |
| All-Digital Circuits for Measurement of Spatial Variation in Digital Circuits | 13 | 1.12 | 2010 |
| Measurement And Analysis Of Contact Plug Resistance Variability | 7 | 0.77 | 2009 |
| A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays | 14 | 3.64 | 2007 |
| Performance Variability of a 90GHz Static CML Frequency Divider in 65nm SOI CMOS. | 6 | 1.14 | 2007 |
| Variation | 4 | 10.82 | 2007 |
| The care and feeding of your statistical static timer | 10 | 1.96 | 2004 |
| Test Structures for Circuit Yield Assessment and Modeling | 0 | 0.34 | 2003 |
| Test structures for delay variability | 17 | 6.80 | 2002 |
| A methodology for modeling the effects of systematic within-die interconnect and device variation on circuit performance | 51 | 10.89 | 2000 |
| A Matrix Math Library For Java | 2 | 0.59 | 1997 |
| Linking TCAD to EDA—benefits and issues | 1 | 0.43 | 1991 |
