Name
Title | ||
|---|---|---|
A hybrid ESD clamp with thyristor delay element and diodes for low-leakage applications |
Abstract | ||
|---|---|---|
Electrostatic discharge (ESD) and Electrical Overstress (EOS) are well-known problems in integrated circuits that affect the reliability, yield and cost. In addition, it has been reported that ESD/EOS contributes to significantly large fraction of failures [1]. It is important to design ESD protection circuits that are able to prevent these failures. In this work, a 65 nm hybrid ESD power supply clamp, which consists of static and transient clamps, for low leakage applications is presented. A diode configuration is used as a static clamp, while the transient clamp consists of a PMOS as the main transistor with body bias and thyristor as a delay element. Simulation and measurement results show that the clamp has fast response for ESD-like event. Extensive stability analysis demonstrates that the clamp is stable against false triggering, oscillation, power supply noise and latch-up. Carried out measurement results also show that the clamp is capable of handling 1.55A of current while its leakage is only 32.9nA, whereas the traditional clamp has a leakage of 1.47μA. |
Year | DOI | Venue |
|---|---|---|
2014 | 10.1109/NEWCAS.2014.6934085 | NEWCAS |
Keywords | Field | DocType |
circuit stability,clamps,diodes,electrostatic discharge,failure analysis,integrated circuit reliability,power supply circuits,thyristors,eos,esd protection circuit design,pmos,body bias,current 1.47 mua,current 1.55 a,delay element,diode configuration,electrical overstress,extensive stability analysis,false triggering,hybrid esd power supply clamp,integrated circuits,latch-up,low-leakage applications,oscillation,power supply noise,reliability,size 65 nm,static clamp,thyristor delay element,transient clamps,charged device model (cdm),esd power supply clamps,electrostatic discharge (esd),human body model (hbm),transmission line pulse (tlp) testing,leakage,stress,transistors,latch up | Leakage (electronics),Electrostatic discharge,Computer science,Clamp,Diode,Electronic engineering,Thyristor,Electronic circuit,Transistor,Integrated circuit,Electrical engineering | Conference |
ISSN | Citations | PageRank |
2472-467X | 0 | 0.34 |
References | Authors | |
2 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Elghazali, M. | 1 | 0 | 0.68 |
| Manoj Sachdev | 2 | 669 | 88.45 |
| Opal, A. | 3 | 0 | 0.34 |