Name
Abstract | ||
|---|---|---|
This paper presents a high-resolution magnetic measurement for detecting vulnerable and suspicious areas on cryptography LSI chips. A CMOS 3-stage low-noise amplifier is integrated with a 500-μm×100-μm magnetic pick-up coil to amplify the induced voltage of the coil. Moreover, the Si-substrate area underneath the coil is removed by applying a Focused-Ion-Beam technique to enhance the coil's performance. High resolution magnetic scanning measurements in a shielded box are performed on both a micro-strip line and a cryptography LSI. By making a comparison with a commercial probe, this measurement holds the advantage that higher-resolution magnetic maps in multiple frequency bands and more revealed information can be achieved. |
Year | DOI | Venue |
|---|---|---|
2014 | 10.1109/SAS.2014.6798928 | Sensors Applications Symposium |
Keywords | Field | DocType |
cmos analogue integrated circuits,coils,cryptography,focused ion beam technology,integrated circuit measurement,large scale integration,low noise amplifiers,magnetic field measurement,magnetic sensors,magnetic shielding,microstrip lines,pick-ups,cmos 3-stage low-noise amplifier,cryptography lsi chip,focused-ion-beam technique,high resolution magnetic scanning measurement,high-resolution magnetic field measurement,induced coil voltage amplification,magnetic pick-up coil,microstrip line,shielded box | Electromagnetic shielding,Computer science,Voltage,Inductor,Real-time computing,CMOS,Electromagnetic coil,Magnetic core,Coil noise,Optoelectronics,Amplifier | Conference |
Citations | PageRank | References |
1 | 0.36 | 3 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Nguyen Ngoc Mai Khanh | 1 | 6 | 5.16 |
| Tetsuya Iizuka | 2 | 92 | 33.22 |
| akihiko sasaki | 3 | 1 | 0.36 |
| makoto yamada | 4 | 1 | 0.36 |
| osamu morita | 5 | 1 | 0.36 |
| kunihiro asada | 6 | 273 | 78.26 |