Name
Abstract | ||
|---|---|---|
In this paper we introduce a new class of analog circuits, self-checking analog circuits. We develop and discuss methods to design members of this new class. We target the class of fully differential analog circuits and use the inherent dual-rail code to develop self-checking circuits. We describe the design of a self-checking operational amplifier and the associated subcircuits. Our methodology has wide application as many analog circuits already are or can be transformed into fully differential circuits |
Year | DOI | Venue |
|---|---|---|
1994 | 10.1109/ICVD.1994.282658 | VLSI Design |
Keywords | Field | DocType |
analogue circuits,circuit analysis computing,design for testability,differential amplifiers,linear integrated circuits,mixed analogue-digital integrated circuits,operational amplifiers,circuit simulation,differential analog code,fully differential analog circuits,inherent dual-rail code,mixed signal ICs,online error detection,redesign-for-reliability,self-checking analog circuits,self-checking circuit design,self-checking operational amplifier | Design for testing,Analogue electronics,Analog multiplier,Computer science,Electronic engineering,Electronics,Mixed-signal integrated circuit,Electronic circuit,Operational amplifier,Linear circuit | Conference |
ISSN | Citations | PageRank |
1063-9667 | 15 | 1.59 |
References | Authors | |
1 | 2 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Bapiraju Vinnakota | 1 | 237 | 25.36 |
| Ramesh Harjani | 2 | 242 | 52.65 |