Title
A new method for testing jitter tolerance of SerDes devices using sinusoidal jitter
Abstract
This paper presents a new method for measuring jitter tolerance of a SerDes receiver using the timing misalignment between the jittered source clock and the recovered clock. A sinusoidal jitter is injected into the serial bit stream. The method derives an equation for estimating BER accurately and is 10× faster than the conventional BER test method The accuracy and test speed of the method are verified by 2.5 Gbps and 10 Gbps-SerDes experiments.
Year
DOI
Venue
2002
10.1109/TEST.2002.1041824
ITC
Keywords
Field
DocType
automatic test equipment,clocks,digital systems,error statistics,synchronisation,telecommunication equipment testing,timing jitter,10 Gbit/s,2.5 Gbit/s,BER,SerDes devices,communication devices,jitter tolerance,jittered source clock,recovered clock,serial bit stream,serializer/deserializer devices,sinusoidal jitter,test speed,timing misalignment
Test method,Synchronization,Computer science,Automatic test equipment,Electronic engineering,Real-time computing,Jitter,Bitstream,SerDes
Conference
ISSN
ISBN
Citations 
1089-3539
0-7803-7542-4
12
PageRank 
References 
Authors
1.90
5
4
Name
Order
Citations
PageRank
Takahiro J. Yamaguchi117635.24
Mani Soma249773.41
Muneaki Ishida3154.81
Musha, H.4121.90