Name
Abstract | ||
|---|---|---|
Transient Signal Analysis (TSA) is a testing method that is based on the analysis of a set of VDD transient waveforms measured simultaneously at each supply port. Defect detection is per- formed by applying linear regression analysis to the time or frequency domain representations of these signals. Chip-wide process variation effects introduce signal variations that are correlated across the individual power port measurements. In contrast, defects introduce uncorrelated local variations across these measurements that can be detected as anomalies in the cross-correlation pro- file derived (using regression analysis) from the power port measurements of defect-free chips. This work focuses on the application of TSA to the detection of delay faults. |
Year | DOI | Venue |
|---|---|---|
2003 | 10.1109/TCAD.2002.807896 | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Keywords | DocType | Volume |
VLSI,delays,fault diagnosis,integrated circuit testing,statistical analysis,transient analysis,IDDT testing,cross-correlation profile,defect-oriented test,delay fault detection,frequency domain representations,linear regression analysis,power port measurements,power supply transient signal analysis,testing method,time domain representations,transient waveforms | Journal | 22 |
Issue | ISSN | Citations |
3 | 0278-0070 | 7 |
PageRank | References | Authors |
1.09 | 11 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| James F. Plusquellic | 1 | 109 | 15.02 |
| Abhishek Singh | 2 | 24 | 3.42 |
| Chintan Patel | 3 | 385 | 37.44 |
| Anne E. Gattiker | 4 | 117 | 17.78 |