Name
Abstract | ||
|---|---|---|
This-paper characterizes the effectiveness of an error detection technique that addresses transient faults induced by the environment (radiation, EMC) in processor-based architectures. Experimental results obtained from fault injection sessions performed on two platforms built around a 32-bit digital signal processor and an 8-bit microcontroller, provide objective figures about the efficiency of the proposed approach. |
Year | DOI | Venue |
|---|---|---|
2003 | 10.1109/DFTVS.2003.1250134 | DFT |
Keywords | Field | DocType |
digital signal processing chips,error detection,fault tolerant computing,integrated circuit reliability,integrated circuit testing,microcontrollers,safety-critical software,transient response,32 bit,8 bit,EMC induced faults,SEU,digital signal processor,environment induced transient faults,fault injection,fault tolerance,microcontroller,processor-based architectures,radiation induced faults,safety-critical applications,single event upset,software error detection technique,transient bit-flip detection efficiency | Stuck-at fault,General protection fault,Computer science,Digital signal processor,Software fault tolerance,Real-time computing,Electronic engineering,Software,Microcontroller,Fault injection,Fault indicator | Conference |
ISSN | ISBN | Citations |
1550-5774 | 0-7695-2042-1 | 2 |
PageRank | References | Authors |
0.38 | 9 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| B. Nicolescu | 1 | 80 | 6.07 |
| Paul Peronnard | 2 | 15 | 2.32 |
| Raoul Velazco | 3 | 124 | 19.48 |
| Yvon Savaria | 4 | 566 | 139.13 |