Name
Abstract | ||
|---|---|---|
The traditional ATPG method relies upon faults to target all defects. Since faults do not model all possible defects, testing quality depends on the fortuitous detection of non-target defects. By analyzing different ATPG approaches, this paper intends to identify critical factors that may greatly affect the fortuitous detection. For enhancing the fortuitous detection of non-target defects through target faults, new concepts and novel ATPG methods are proposed |
Year | DOI | Venue |
|---|---|---|
1996 | 10.1109/TEST.1996.557120 | Washington, DC |
Keywords | DocType | ISSN |
automatic testing,fault diagnosis,integrated circuit testing,logic testing,ATPG methods,DROP,WEIGHT,bridging faults,defect conflict factor,fortuitous detection,nontarget defect detection,stuck-at fault test,target faults,test space restriction,testing quality | Conference | 1089-3539 |
ISBN | Citations | PageRank |
0-7803-3541-4 | 21 | 2.11 |
References | Authors | |
7 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Li-C. Wang | 1 | 527 | 50.67 |
| M. R. Mercer | 2 | 353 | 47.36 |
| T. W. Williams | 3 | 1049 | 194.23 |