Name
Abstract | ||
|---|---|---|
The paper presents a methodology for the simulation of massive number of device-level transient faults. Fault injection locations and the gate around those locations are extracted and evaluated with SPICE. The extracted sub-circuits are exercised exhaustively while fault-injections are performed. Faulty behavior at the outputs of each sub-circuit is recorded in a dictionary, along with the associated input vector, fault-injection time, and location. The recorded logical errors are injected concurrent transient simulator is developed to allow simultaneous evaluation of a massive number of fault-injections, in a single simulation pass. The methodology is illustrated by a case study of MC68000 microprocessor. |
Year | DOI | Venue |
|---|---|---|
1993 | 10.1109/ICCAD.1993.580023 | Santa Clara, CA, USA |
Keywords | Field | DocType |
SPICE,MC68000 microprocessor,SPICE,associated input vector,device-level transient faults,fault behavior dictionary,fault injection locations,fault-injections,logical errors,simultaneous evaluation,sub-circuits | Stuck-at fault,Spice,Computer science,Microprocessor,Real-time computing,Electronic engineering,Fault injection,Fault indicator | Conference |
ISBN | Citations | PageRank |
0-8186-4490-7 | 9 | 1.73 |
References | Authors | |
101 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Gwan Choi | 1 | 369 | 56.66 |
| Ravishankar K. Iyer | 2 | 3489 | 504.32 |
| Saab, D.G. | 3 | 186 | 20.19 |