Name
Abstract | ||
|---|---|---|
This paper introduces a new method for evaluating non-idealities in ADCs using wavelet transforms. Compared with conventional testing methods, this method can shorten the test time and improve test quality during production testing of ADCs |
Year | DOI | Venue |
|---|---|---|
1997 | 10.1109/TEST.1997.639640 | Washington, DC |
Keywords | DocType | ISSN |
VLSI,analogue-digital conversion,computational complexity,digital simulation,electronic equipment testing,production testing,wavelet transforms,ADC testing,dynamic testing,production testing,test quality,test time,wavelet transforms | Conference | 1089-3539 |
ISBN | Citations | PageRank |
0-7803-4209-7 | 9 | 1.35 |
References | Authors | |
8 | 2 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Takahiro J. Yamaguchi | 1 | 176 | 35.24 |
| Mani Soma | 2 | 497 | 73.41 |