Name
Title | ||
|---|---|---|
Electric field for detecting open leads in CMOS logic circuits by supply current testing |
Abstract | ||
|---|---|---|
Open leads are one type of defect occurring frequently when logic circuits are implemented on printed circuit boards (PCBs) with ICs. A powerful supply current test method has been proposed for detecting an open lead in a CMOS logic circuit. The method is based on the supply current of a circuit under test which flows when a time-varying electric field is supplied from the outside of the circuit. The paper proposes a time-varying electric field which enables us to detect open leads in a CMOS logic circuit with an inexpensive test setup. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1109/ISCAS.2005.1465257 | ISCAS (3) |
Keywords | Field | DocType |
CMOS logic circuits,electric fields,printed circuit testing,CMOS logic circuits,board under test,open lead detection,supply current testing,time-varying electric field | Pull-up resistor,Logic gate,Logic probe,Pass transistor logic,Computer science,Adiabatic circuit,Electronic engineering,Logic family,Diode-or circuit,Electrical engineering,Asynchronous circuit | Conference |
ISSN | ISBN | Citations |
0271-4302 | 0-7803-8834-8 | 0 |
PageRank | References | Authors |
0.34 | 6 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Masaki Hashizume | 1 | 98 | 27.83 |
| Masahiro Ichimiya | 2 | 4 | 2.36 |
| Hiroyuki Yotsuyanagi | 3 | 70 | 19.04 |
| Takeomi Tamesada | 4 | 45 | 12.49 |