Name
Abstract | ||
|---|---|---|
Built-in self-test (BIST) is an attractive approach to detect delay faults because of its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique that has been successfully applied to stuck-at fault testing. As delay faults have lower random pattern testability than stuck-at faults, the need for DLBIST schemes has increased. However, an extension to delay fault testing is not trivial as this necessitates the application of pattern pairs. As a consequence, delay fault testing is expected to require a larger mapping effort and logic overhead than stuck-at fault testing. With this in mind, the authors consider the so-called transition fault model, which is widely used for complexity reasons, and an extension of a DLBIST scheme for transition fault testing is presented. Functional justification is used to generate the required pattern pairs. The efficiency of the extended scheme is investigated using difficult-to-test industrial designs |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/ETS.2006.12 | Computers & Digital Techniques, IET |
Keywords | DocType | Volume |
logic circuits,fault simulation,transition fault model,delay fault detection,transition fault testing,built-in self test,built-in self-test,logic overhead,fault diagnosis,stuck-at fault testing,deterministic logic BIST,deterministic logic bist,random pattern testability,delay test.,pattern testability,logic testing | Conference | 1 |
Issue | ISSN | ISBN |
3 | 1751-8601 | 0-7695-2566-0 |
Citations | PageRank | References |
7 | 0.53 | 21 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Valentin Gherman | 1 | 36 | 3.35 |
| Hans-Joachim Wunderlich | 2 | 1822 | 155.30 |
| Juergen Schloeffel | 3 | 47 | 5.51 |
| Michael Garbers | 4 | 7 | 0.53 |