Name
Title | ||
|---|---|---|
CMOS open defect detection based on supply current in time-variable electric field and supply voltage application |
Abstract | ||
|---|---|---|
In this paper, a new test method is proposed for detecting open defects in CMOS ICs. The method is based on supply current of ICs generated by applying time-variable supply voltage and electric field from the outside of the ICs. The feasibility of the test is examined by some experiments. The empirical results promise us that by using the method, open defects in CMOS ICs can be detected. Also, the test input vectors for the test method are proposed and it is shown that they can be generated more easily than functional test methods based on stuck-at fault models. |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1109/ATS.2001.990269 | Asian Test Symposium |
Keywords | Field | DocType |
CMOS logic circuits,automatic testing,fault diagnosis,integrated circuit testing,logic testing,CMOS,logic ICs,open defect detection,supply current,supply voltage application,test input vectors,test method,time-variable electric field | Test method,Electric field,Computer science,Semiconductor device modeling,Fault detection and isolation,Voltage,Automatic testing,CMOS,Electronic engineering,Electrical engineering,Supply current | Conference |
ISSN | ISBN | Citations |
1081-7735 | 0-7695-1378-6 | 1 |
PageRank | References | Authors |
0.43 | 3 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Masaki Hashizume | 1 | 98 | 27.83 |
| Masahiro Ichimiya | 2 | 4 | 2.36 |
| Hiroyuki Yotsuyanagi | 3 | 70 | 19.04 |
| Takeomi Tamesada | 4 | 45 | 12.49 |