Name
Title | ||
|---|---|---|
On the exploitation of the inherent error resilience of wireless systems under unreliable silicon |
Abstract | ||
|---|---|---|
In this paper, we investigate the impact of circuit misbehavior due to parametric variations and voltage scaling on the performance of wireless communication systems. Our study reveals the inherent error resilience of such systems and argues that sufficiently reliable operation can be maintained even in the presence of unreliable circuits and manufacturing defects. We further show how selective application of more robust circuit design techniques is sufficient to deal with high defect rates at low overhead and improve energy efficiency with negligible system performance degradation. |
Year | DOI | Venue |
|---|---|---|
2012 | 10.1145/2228360.2228451 | Design Automation Conference |
Keywords | Field | DocType |
logic design,radiocommunication,telecommunication network reliability,circuit design,circuit misbehavior,error resilience,manufacturing defects,parametric variations,unreliable circuits,unreliable silicon,voltage scaling,wireless communication systems,Energy-Efficiency,Error-Resiliency,Memory Failures,Reliability,Wireless Communication Systems,Yield | Psychological resilience,Wireless,Computer science,Efficient energy use,Circuit design,Real-time computing,Electronic engineering,Robustness (computer science),Parametric statistics,Throughput,Electronic circuit | Conference |
ISSN | ISBN | Citations |
0738-100X | 978-1-4503-1199-1 | 12 |
PageRank | References | Authors |
0.67 | 6 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Georgios Karakonstantis | 1 | 317 | 37.08 |
| Christoph Roth | 2 | 52 | 3.56 |
| Christian Benkeser | 3 | 64 | 7.86 |
| A. Burg | 4 | 1426 | 126.54 |