Name
Title | ||
|---|---|---|
A method of one-pass seed generation for LFSR-based deterministic/pseudo-random testing of static faults |
Abstract | ||
|---|---|---|
This paper proposes a method of LFSR seed generation for deterministic and pseudo-random testing of static faults. The proposed method directly generate seeds by using ATPG and avoids unsuccessful encoding of conventional two-pass generation methods. The effectiveness of the proposed method is evaluated through experiments for several LFSRbased pseudo-random pattern generators. The quality of seeds generated by the proposed method is evaluated by stuck-at fault coverage when test patterns are expanded from seeds. |
Year | DOI | Venue |
|---|---|---|
2015 | 10.1109/LATW.2015.7102512 | Test Symposium |
Keywords | Field | DocType |
automatic test pattern generation,electrical faults,integrated circuit testing,shift registers,atpg,lfsr-based deterministic pseudorandom testing,lfsr-based pseudorandom pattern generators,linear feedback shift register,one-pass seed generation,static faults,lfsr seed generation,constrained atpg,deterministic test,phase shifter,pseudo-random test,scan-based bist,logic gates,encoding | Automatic test pattern generation,Logic gate,Linear feedback shift register,Fault coverage,Computer science,Algorithm,Pseudo random testing,Built-in self-test,Encoding (memory) | Conference |
Citations | PageRank | References |
7 | 0.54 | 4 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Takanori Moriyasu | 1 | 7 | 0.54 |
| Satoshi Ohtake | 2 | 135 | 21.62 |