Paper Info
Title
Combined trap generation and transient trap occupancy model for time evolution of NBTI during DC multi-cycle and AC stress
Abstract
A transient trap occupancy model is proposed to determine the charged state of generated NIT in real time during successive stress (pulse ON) and recovery (pulse OFF) cycles for DC and AC NBTI stress. The model converts ΔNIT (trap density) to compute the ΔVIT (voltage shift) subcomponent of overall ΔVT; time evolution of ΔNIT is obtained using numerical RD simulation for multi-cycle DC and low f AC, and a calibrated compact model for high f AC stress to reduce simulation time. A cyclostationary stretched exponential model is used for the ΔVHT subcomponent of ΔVT. The complete model is used to predict time evolution of ΔVT (=ΔVIT + ΔVHT), measured using Ultra-Fast MSM method in HKMG p-MOSFETs for multiple and completely arbitrary DC stress and recovery cycles and for AC stress at different duty, f and pulse low bias. Finally a compact model is proposed, which is capable of providing AC/DC ratio at fixed time and compared to the transient model for different gate activity.
Year
DOI
Venue
2015
10.1109/IRPS.2015.7112725
Reliability Physics Symposium
Keywords
Field
DocType
mosfet,negative bias temperature instability,transient analysis,ac stress,dc multicycle,dc stress,hkmg p-mosfet,nbti,rd simulation,calibrated compact model,combined trap generation,cyclostationary stretched exponential model,metal oxide semiconductor field effect transistor,reaction-diffusion simulation,recovery cycle,time evolution,transient trap occupancy model,ultrafast msm method,compact model,transient model,trap generation,trap occupancy,degradation,computational modeling,stress,predictive models,mathematical model
Fixed time,Analytical chemistry,Exponential function,Numerical models,Voltage,Trap density,Pulse (signal processing),Electronic engineering,Time evolution,Engineering,Cyclostationary process
Conference
ISSN
Citations 
PageRank 
1541-7026
11
1.01
References 
Authors
3
3
Name
Order
Citations
PageRank
Nilesh Goel1111.34
Tejas Naphade2111.01
Mahapatra, S.3224.83