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MAHAPATRA, S.
Author Info
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Name
Affiliation
Papers
MAHAPATRA, S.
Indian Inst Technol, Dept Elect Engn, Bombay 400076, Maharashtra, India
10
Collaborators
Citations
PageRank
41
22
4.83
Referers
Referees
References
90
128
28
Search Limit
100
128
Publications (10 rows)
Collaborators (41 rows)
Referers (90 rows)
Referees (100 rows)
Title
Citations
PageRank
Year
Hot Carrier Degradation in Cryo-CMOS
1
0.39
2020
BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array – including Sense Amplifiers and Write Drivers – under Processor Activity
1
0.36
2020
On the Frequency Dependence of Bulk Trap Generation During AC Stress in Si and SiGe RMG P-FinFETs
0
0.34
2019
Controversial issues in negative bias temperature instability.
2
0.58
2018
TCAD modeling for reliability.
1
0.48
2018
Epitaxial Gd<inf>2O</inf><inf>3</inf>on Si (111) Substrate by Sputtering to Enable Low Cost SOI
0
0.34
2018
A review of NBTI mechanisms and models.
1
0.43
2018
Combined trap generation and transient trap occupancy model for time evolution of NBTI during DC multi-cycle and AC stress
11
1.01
2015
Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at low voltages
4
0.50
2015
Time dependent variability in RMG-HKMG FinFETs: Impact of extraction scheme on stochastic NBTI
1
0.40
2015
1