Title | ||
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Hardware-efficient on-chip generation of time-extensive constrained-random sequences for in-system validation |
Abstract | ||
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Linear Feedback Shift Registers (LFSRs) have been extensively used for compressed manufacturing test. They have been recently employed as a foundation for porting constrained-random stimuli from a pre-silicon verification environment to in-system validation. This work advances this concept by improving both the hardware efficiency and the duration of in-system validation experiments. |
Year | DOI | Venue |
---|---|---|
2013 | 10.1145/2463209.2488882 | Design Automation Conference |
Keywords | Field | DocType |
formal verification,logic testing,shift registers,LFSR,constrained-random stimuli,hardware-efficient on-chip generation,in-system validation,linear feedback shift register,presilicon verification environment,time-extensive constrained-random sequences,Constrained-Random Sequences,In-System Validation | System validation,Shift register,Post-silicon validation,Computer science,Logic testing,Electronic engineering,Real-time computing,Porting,Computer hardware,Formal verification | Conference |
ISSN | Citations | PageRank |
0738-100X | 4 | 0.42 |
References | Authors | |
13 | 3 |
Name | Order | Citations | PageRank |
---|---|---|---|
Adam B. Kinsman | 1 | 141 | 10.05 |
Ho Fai Ko | 2 | 234 | 14.44 |
Nicola Nicolici | 3 | 807 | 59.91 |