Title
An area-efficient, standard-cell based on-chip NMOS and PMOS performance monitor for process variability compensation
Year
DOI
Venue
2012
10.1109/COOLChips.2012.6216586
COOL Chips
Keywords
Field
DocType
oscillators,nmos transistor,semiconductor devices,measurement system,chip,monitor,cmos integrated circuits,standard cell,system on a chip,ring oscillator
Ring oscillator,System on a chip,NMOS logic,Duty cycle,Electronic engineering,CMOS,Engineering,PMOS logic,Transistor,MOSFET,Electrical engineering
Conference
Citations 
PageRank 
References 
3
0.44
3
Authors
5
Name
Order
Citations
PageRank
tatsuya yamagishi130.44
takahiro shiozawa230.44
k horisaki330.44
Hideki Hara411013.63
Yasuo Unekawa5325.89