Title
Area-efficient transient power-rail electrostatic discharge clamp circuit with mis-triggering immunity in a 65-nm CMOS process
Abstract
A novel, area-efficient transient power-rail electrostatic discharge (ESD) clamp circuit is proposed in this work. Current-mirror capacitors are used to reduce the layout area. Logic threshold voltages of inverters are modified to ensure a fully active on-state for the clamp device in ESD conditions. The proposed circuit reduces the layout area by about 56% compared with a circuit without current-mirror capacitors. Transmission line pulse (TLP) test results based on a 65-nm CMOS process demonstrate that the proposed circuit is an efficient on-chip ESD protection scheme for this process. In addition, the proposed circuit achieves a good immunity to mis-triggering with respect to fast power-up transitions.
Year
DOI
Venue
2016
10.1007/s11432-015-5398-3
SCIENCE CHINA Information Sciences
Keywords
DocType
Volume
electrostatic discharge (ESD), power-rail clamp circuit, transmission line pulse (TLP), current mirror, mis-triggering, 静电放电, 电源钳位保护电路, 瞬态传输线脉冲, 电流镜, 误触发
Journal
59
Issue
ISSN
Citations 
4
1869-1919
1
PageRank 
References 
Authors
0.40
4
6
Name
Order
Citations
PageRank
Yuan Wang11713.39
Guangyi Lu285.15
haibing guo310.40
Jian Cao474.76
Song Jia567.00
zhang6109.77