Name
Abstract | ||
|---|---|---|
In this paper we present a tool based approach for an aging-aware design method. Extending the g
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sizing method by operating point-dependent degradation caused by BTI and HCD enables an innovative design flow. This design flow considers performance characteristics for a fresh circuit and also those of a degraded circuit at design time. Once the degradation from a single transistor is computed, the GMID-Tool does not need any further SPICE or aging simulation. The impact of the change in design methodology is shown for a typical differential amplifier structure. |
Year | DOI | Venue |
|---|---|---|
2015 | 10.1109/MIXDES.2015.7208525 | 2015 22nd International Conference Mixed Design of Integrated Circuits & Systems (MIXDES) |
Keywords | Field | DocType |
Aging-aware design,transconductance efficiency,bias temperature instability (BTI),hot carrier degradation,circuit degradation | Spice,Computer science,Electronic engineering,Design flow,Design methods,Control engineering,Degradation (geology),Sizing,Transconductance,Transistor,Differential amplifier | Conference |
Citations | PageRank | References |
2 | 0.45 | 7 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Nico Hellwege | 1 | 11 | 4.18 |
| Nils Heidmann | 2 | 14 | 3.89 |
| marco erstling | 3 | 2 | 0.45 |
| Dagmar Peters-Drolshagen | 4 | 39 | 12.87 |
| Steffen Paul | 5 | 142 | 40.96 |